>> P.12-11
VisionMeasuringSystemsHigh-accuracy3DMeasuringSystemQVWLIcanmeasurecoordinatesanddimensionsandassessmicro-3Dformswithoutcontactinasinglemachine.3DdatacapturedbytheWLIopticalsystemenables3Dsurfacetextureanalysisand3Droughnessanalysis.Large-sizedCNCVisionMeasuringSystemThemovingbridgedesignmakesitsuitableformeasuringlargeobjectsaswellassmall,thinobjects.Thefixedstagedesignallowsforamoresimplifieddesignoftheworkpiecefixture.Non-contact3DMeasuringSystemQVWLIProLarge-sizedVisionMeasuringSystemQVACCELAhigh-accuracy3DmeasuringsystemwithaWLIopticalsystemthatcanmeasuremicro-formstothesub-micrometerlevel.Avisionmeasuringsystemwithamoving-bridgestructuresuitableformeasurementsofalargeworkpiece.EUX/EUY,MPE:0.8+2L/1000µm(L:Measuringlengthinmm)1X/E1Y:1.5+3L/1000µmE(L:Measuringlengthinmm)ProductcatalogE14001ProductcatalogE14028Micro-formMeasuringSystemTheversatile,high-accuracymicro-formmeasuringsystemcanmeasureawiderangeofworkpieces,frommicro-formstolargerpieces.VisionMeasuringSystemsCNCVisionMeasuringMachinewithMicro-formScanningProbeMicro-formMeasuringSystemMiSCANVisionSystemComplexmeasuringmachinedesignedforscanningmeasurements.1X/E1Y:1.5+3L/1000µm1X/E1Y:0.8+2L/1000µm(forMVSHypermodel)0,MPE:1.9+4L/1000µm*(whenusingSP25Mprobesystem)EEE(L:Measuringlengthinmm)12-11UMAPVisionSystemTYPE2Designedformicro-dimensionandformmeasurementswithastylusballdiameterassmallas15μm.EUX/EUY,MPE:0.8+2L/1000µm(forUVSHypermodel)EUX/EUY,MPE:0.35+1.3L/1000µm(forUVSULTRAmodel)EE(L:Measuringlengthinmm)1X/E1Y:1.7+3L/1000µm*(whenusingUMAPprobesystem(forUVSHypermodel))1X/E1Y:1.5+3L/1000µm*(whenusingUMAPprobesystem(forUVSULTRAmodel))*Specificationsvarybyconfiguration,sizeandthermalenvironment.ProductcatalogE14000
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